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In order to reduce the effect of tolerance in fault diagnosis of analog circuit, a node admittance matrix (NAM) based method is proposed in the paper. In this method, the fault feature vector of the circuit under test (CUT) is established based on its NAM. Before test, set of fault feature vectors of CUT with fault category information is obtained by simulation. During testing, the fault feature vector of CUT is measured first. Fault diagnosis is completed by judging it belongs to which fault category in the set. The proposed method is not affected by tolerance. Its effectiveness is validated through a benchmark circuit.